APT User Meeting

Session

Advancement FIB Preparation

19 Nov 2024, 15:00

Room 203 (large seminar room) (Max-Planck-Institut für Eisenforschung GmbH)

19. How Cold is Cold Enough? Exploring the effects of cryogenic temperature on FIB sample preparation for APT samples

James Douglas (Imperial College London)

19/11/2024, 15:00

Cryogenic sample preparation for atom probe tomography is becoming more widespread and has allowed the analysis of many new material systems including frozen liquids, solid/liquid interfaces and soft matter. Much of the work has been adapted from the life sciences where temperature control is very stringent and restrict the user to temperatures below the vitrification point of water,...

12. The advance analysis of liquid containing materials using cryogenic FIB

Min Wu (THERMO FISHER SCIENTIFIC)

19/11/2024, 15:20

The current materials science research and industrial development needs bring new challenges of analyzing unconventional samples inside a FIB-SEM, such as liquid form samples, solid liquid inter-face samples, and other soft and beam sensitive samples. Often, such materials tend to be air sen-sitive as well. Hence, an inert gas filled glove box is also needed in sample handling. Prior to the...

32. Workflows and Capabilities enabled with Zeiss crossbeam laser

Dr Martina Heller (Carl Zeiss Microscopy GmbH)

19/11/2024, 15:40

The new technological improvement of all type of materials, including functional, semiconductors, micro-electro-mechanical, medical, needs a proper microstructure investigation from mm- up to nmscale. One of the most used techniques is the focused ion beam (FIB), with a Ga+ beam for materials removal and specimen preparation for much high resolution techniques such as (TEM, APT ,..etc )....