Cryogenic sample preparation for atom probe tomography is becoming more widespread and has allowed the analysis of many new material systems including frozen liquids, solid/liquid interfaces and soft matter. Much of the work has been adapted from the life sciences where temperature control is very stringent and restrict the user to temperatures below the vitrification point of water,...
The current materials science research and industrial development needs bring new challenges of analyzing unconventional samples inside a FIB-SEM, such as liquid form samples, solid liquid inter-face samples, and other soft and beam sensitive samples. Often, such materials tend to be air sen-sitive as well. Hence, an inert gas filled glove box is also needed in sample handling. Prior to the...
The new technological improvement of all type of materials, including functional, semiconductors, micro-electro-mechanical, medical, needs a proper microstructure investigation from mm- up to nmscale. One of the most used techniques is the focused ion beam (FIB), with a Ga+ beam for materials removal and specimen preparation for much high resolution techniques such as (TEM, APT ,..etc )....
