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APT User Meeting

19–21 Nov 2024
Max-Planck-Institut für Eisenforschung GmbH
Europe/Berlin timezone

For more information about the workshop, please contact

Session

Advancement in Instrumentation

19 Nov 2024, 13:00
Room 203 (large seminar room) (Max-Planck-Institut für Eisenforschung GmbH)

Room 203 (large seminar room)

Max-Planck-Institut für Eisenforschung GmbH

Max-Planck-Str. 1 40237 Düsseldorf

Presentation materials

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  1. 25. Advancements in 3D Field Ion Microscopy for Atomic-Scale Material Characterization
    Benjamin Klaes (GPM-Université de Rouen)
    19/11/2024, 13:00

    Starting in the 1950s and continuing over the next two decades, field ion microscopy (FIM) became the first true atomic-scale microscopy technique [1], allowing for the direct imaging of individual atom positions on a material's surface with sub-angstrom precision [2]. By controlling the field evaporation of atoms from the surface, a three-dimensional (3D) reconstruction can be achieved...

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  2. 10. Project SATMET: Combining Atom Probe Tomography and Transmission Electron Microscopy in a single tool
    Aidar Zakirov (GPM Rouen)
    19/11/2024, 13:40

    During the last few decades, Atom Probe Tomography (APT) has proven itself as one of the best material characterization tools due to the combination of atomic resolution and 3D reconstruction capabilities. Still, there are some limitations, as the crystallographic information obtained from APT data is limited. To tackle that issue, a correlative approach of combined Transmission Electron...

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  3. 31. Technology and Applications of the LEAP 6000XR and Invizo 6000 atom probes
    Rene Chemnitzer (Cameca Instruments)
    19/11/2024, 14:00

    Rene Chemnitzer (Cameca)
    “Technology and Applications of the LEAP 6000XR and Invizo 6000 atom probes”

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  4. 36. AdAPTS: An Adaptive Atom Probe Tomography Simulation Library
    Julian Lüken (University of Antwerp)
    19/11/2024, 14:20

    AdAPTS: An Adaptive Atom Probe Tomography Simulation Library

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