Starting in the 1950s and continuing over the next two decades, field ion microscopy (FIM) became the first true atomic-scale microscopy technique [1], allowing for the direct imaging of individual atom positions on a material's surface with sub-angstrom precision [2]. By controlling the field evaporation of atoms from the surface, a three-dimensional (3D) reconstruction can be achieved...
During the last few decades, Atom Probe Tomography (APT) has proven itself as one of the best material characterization tools due to the combination of atomic resolution and 3D reconstruction capabilities. Still, there are some limitations, as the crystallographic information obtained from APT data is limited. To tackle that issue, a correlative approach of combined Transmission Electron...
Rene Chemnitzer (Cameca)
“Technology and Applications of the LEAP 6000XR and Invizo 6000 atom probes”
AdAPTS: An Adaptive Atom Probe Tomography Simulation Library
